Electron Microscopy, NMR & Mass Spectometry News

JEOL and ACD/Labs Sign Distribution Agreement for ACD/NMR software

JEOL and Advanced Chemistry Development, Inc. (ACD/Labs) announced they have concluded a distribution agreement for ACD/NMR software.

NMR Predictor Suite having a structure predictive function is the software which can predict an NMR spectrum from chemical structure information, among ACD/NMR software. It is the tool which can perform structure analysis easily. For a user who is considering purchase of NMR for the first time, that will be valuable source of structral analysis information.

"We're very excited to work with JEOL and bring our tools to their customers around the world," Dimitris Argyropoulos, NMR Business Manager at ACD/Labs, commented. "JEOL has been producing scientific instrumentation for the past 70 years and is a well-known and respected supplier of NMR instruments. The ability to use ACD/Labs software in combination with NMR software Delta for advanced spectra processing, automated structure verification and industry-standard databasing gives JEOL users access to the most advanced tools available. Furthermore, ACD/Labs’ software offers the capability for chemists to process and analyze LC/MS, UV/Vis, IR, and all other analytical data using the same software, regardless of data format."

The JEM-F200 at the NKI is featured in BioTech and Life Sciences

Biotech and Life Sciences has featured the JEM-F200 installed at the NKI. 

IThe article can be found on page 21 in the following link and explains what the NKI will do with the microscope: https://www.biotechnews.eu/fileadmin/pdf/2019-najaar/2019_Biotechnews_november.pdf

JEOL (Europe) BV offering Refurbished Instruments

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

• JEM-1010 100kV TEM with Megaview Camera

               JEM-1010

• JEM-1200EXII 120kV TEM with STEM
• JEM-1200EXII 120kV TEM with Orius Camera and EDX

                      JEM-1200EXII

• JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
• JSM-6060LV Compact W-SEM with SE and BSE detector

               JSM-6060LV 

• JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

               JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com

First structure from the JEM-F200 at the NKI in Amsterdam

The NKI in Amsterdam has completed their first trial on the JEM-F200 equipped with Gatan K2 Camera and Elsa Cryoholder, The result is a 3.4Å reconstruction on Apoferritin. For this test 120 images were taken in 3 hours. Congratulations to Prof. Dr. Titia Sixma and Prof. Dr. Tassos Perrakis and their colleagues with this very promising test result!

JEOL Periodic Table app

JEOL USA has developed an app to assist researchers with EDS, NMR and MS research. Using the JEOL Periodic Table app you have quick and easy access to the spectral data of all known elements while doing EDS in electron microscopy, nuclear magnetic resonance or mass spectrometry.

The app is available in the apple appstore: https://itunes.apple.com/us/app/jeol-usa-periodic-table/id1459184462?ls=1&mt=8

JEOL NMR in high demand

The New JNM-ECZ High field NMR series is booming. Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems. With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

JEOL Celebrating 50 years of SEM

In 2016 we are celebrating 50 years of JEOL scanning electron microscopes!

Since the launch of our first SEM in 1966, the JSM-1, we have been constantly developing and improving the ease-of-use and the performance of our SEMs, with the support of our customers. 

Since 1966, more than 22.000 JEOL SEMs have been installed worldwide!

Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

24^th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University:

·         Inflammation Research Center (VIB-IRC)

·         Plant Systems Biology (VIB-PSB)

·         Medical Biotechnology Center (VIB-MBC)

·         VIB Core facilities

·         Center for Medical Genetics Ghent University (CMGG)

In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment.

The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.

Pictures:

TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility.

BOTTOM Mrs Riet De Rycke (far right) demonstrates the 1400Plus to (starting first row and from left to right): Prof. Nico Callewaert, Director MBC; Prof. Dirk Inzé, Director PSB; Dr. Jo Bury, Managing Director VIB, Prof. Bart Lambrecht, Director IRC; Prof. Anne De Paepe, Rector and Director CMGG.

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

• Smart- design, with a new intuitive user interface
• Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
• Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
• Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
• Specporter, an auto holder loading/unloading device.
• Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
• Dual SDD, for very fast EDS analysis and minimal sample damage.
• Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)