Electron Microscopy, NMR & Mass Spectometry News

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• Release of the JEM-F200, a multi purpose TEM

  JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM. The F2 incorporates many new features:  Smart- design, with a new intuitive user interface Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements. Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS. Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample ...
• Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

  JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation. Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include: High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).
• Release of the JSM-7900 UHR FEG-SEM

  JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment. Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current. The system is the premier example of the JEOL’s advanced electron optics technology. For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html
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  JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

  JEOL announced the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of m/z 10-30,000 - the highest resolving power of all commercial MALDI-TOF systems. JEOL’s patented technology consists of a staggered figure-8 ion trajectory of 17 meters. By refocusing the ion packets during each turn, the divergence of the ions is reduced over the flight distance. The SpiralTOF ion optical system is engineered to overcome the limits of delayed extraction with kinetic energy convergence resulting in high sensitivity, resolving power and mass accuracy (less than 1ppm) over a wide mass range. To meet the diverse needs of researchers, the SpiralTOF is available in four configurations: MALDI-TOFMS with unsurpassed high mass resolving power and high mass accuracy Linear TOF option for high sensitivity analysis of high molecular weight samples and/or those that undergo post-source decay TOF/TOF option for ...
• JEOL released the JSM-IT800 FE-SEM

  JEOL has released the JSM-IT800 FE-SEM, the most powerful SEM to date, guaranteeing a resolution of 0.5nm @ 15kV and 0.9nm at 500V. The JSM-IT800 incorporates our In-lens Schottky Plus field emission electron gun for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a seamless GUI "SEM Center" for full integration of a JEOL energy dispersive X-ray spectrometer (EDS). Furthermore, the JSM-IT800 allows for two types of objective lens configurations, offering different versions to satisfy various users requirements. The two versions of the JSM-IT800 include the Hybrid Lens (HL) version for a general-purpose SEM and the Super Hybrid Lens (SHL) version for enhanced high resolution observation and various analyses. In addition, the JSM-IT800 of the SHL version comes with a new Upper Hybrid Detector (UHD) to acquire higher signal-to-noise ratio images for the study of fine structures of specimens. The JSM-IT800 can also be equipped with a new Scintillator Backscattered Electron Detector (SBED) and a Versatile Backscattered Electron Detector (VBED). The SBED enables acquisition of images with high responsiveness and produces sharp material contrast ...
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  Multi-touch Interface Creates New Electron Microscope Experience with JEOL InTouch Scope™

  JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen. Ease of use is a key feature of all JEOL SEMs, and the versatile InTouch Scope has functions that users of all levels will appreciate: automatic SEM condition setup based on sample type simultaneous multiple live image and movie capture easy sample navigation at 5x – 300,000x magnifications quantitative and qualitative elemental analysis low and high vacuum operation Wireless capability. The In-Touch Scope features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. An onboard ...