Electron Microscopy, NMR & Mass Spectometry News

Related Posts

• JPS-9030: The XPS for high-speed, high-precision depth profiling

  In recent years, there has been a growing demand to perform high quality surface analysis quickly, easily and reproducibly on any kind of sample for any level user. The JPS-9030 is equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design. Main Features Depth profiling optimized for the application The newly-developed Kaufman-type etching ion source provides etching rates from 1 nm/min to 100 nm/min (SiO2equivalent), and allows a wide range of settings. It is capable of depth profiles suitable for any application, from measurements demanding precision to processes that require speed. The mounting of the Kaufman-type etching ion source to the specimen exchange chamber facilitates prevention of  contamination of the measurement chamber. Newly-developed software provides even greater ease-of-use SpecSurf Ver. 2.0 now incorporates a ribbon-style GUI, offering a user-friendly environment in which all operations can be performed with the mouse. With JEOL’s own automatic qualitative analysis function, it is possible to sequentially perform qualitative, quantitative and chemical state analyses for multiple acquisition points. Ultra-high surface sensitivity The JPS-9030 supports techniques like Angle-Resolved XPS (ARXPS) and ...
• JEM-2100Plus: A new 200kV Transmission Electron Microscope

  The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies. Main Features Designed to ease of operation 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation. A complete range of automated functions The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation. Advanced integration The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction. Image view/edit software Viewer software supports off-line image viewing and editing. Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries. Main Specifications Maximum accelerating voltage 200kV Guaranteed resolution 0.14 nm(TEM lattice image) Magnification x30 to x800,000 The JEM-2100Plus can be configured to support a variety of applications from cryo TEM to ultra high ...
• 
  JSM-7100F Thermal field emission electron microscope

  Observation of nano-structures The unique high power optics of JSM-7100F guarantees 1.2nm resolution. High magnification for the study of nano-structures is easily obtained. Stable high precision analysis The in-lens thermal FEG produces a stable large probe current. You can obtain high quality observation and analysis results. The emitter is guaranteed for 3 years. Magnetic specimens The objective lens of the JSM-7100F does not form magnetic field around a specimen. Magnetic specimens can be observed and analyzed without restriction. Analysis of nano-structures A small probe diameter is obtained with the patented aperture angle optimizing lens. You can acquire high precision analyses and high quality elemental maps in a short time by using a large probe current. A variety of analytical equipment including EDS, WDS, and EBSD can be mounted their ideal geometry. Clean vacuum A specimen is introduced through the specimen exchange airlock chamber. The specimen chamber is always kept in clean high vacuum. The unique one action specimen exchange mechanism lets you insert and remove a specimen with simple operation. The specimen chamber is pumped with a TMP. In-lens thermal FEG The patented in-lens thermal FEG is efficient and produces ...
• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...
• 
  Centurio Large Angle SDD-EDS

  Centurio is a next-generation Silicon Drift Detector (SDD) EDS that collects X-rays from S/TEM samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2. Through efficient collection of X-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. Large pixel number EDS maps can be made at rates ten times faster than with the previous EDS designs, with excellent signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration corrected STEM, fast, efficient atomic resolution EDS analysis is possible. Key Features High sensitivity, high throughput analysis Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM. The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered electrons. Specifications Solid angle - High resolution polepiece 0.98 sr - Ultrahigh resolution polepiece 0.8 sr Detection area 100mm2
• Release of the JEM-F200, a multi purpose TEM

  JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM. The F2 incorporates many new features:  Smart- design, with a new intuitive user interface Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements. Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS. Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample ...