Electron Microscopy, NMR & Mass Spectometry News

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• JEOL and ACD/Labs Sign Distribution Agreement for ACD/NMR software

  JEOL and Advanced Chemistry Development, Inc. (ACD/Labs) announced they have concluded a distribution agreement for ACD/NMR software. NMR Predictor Suite having a structure predictive function is the software which can predict an NMR spectrum from chemical structure information, among ACD/NMR software. It is the tool which can perform structure analysis easily. For a user who is considering purchase of NMR for the first time, that will be valuable source of structral analysis information. "We're very excited to work with JEOL and bring our tools to their customers around the world," Dimitris Argyropoulos, NMR Business Manager at ACD/Labs, commented. "JEOL has been producing scientific instrumentation for the past 70 years and is a well-known and respected supplier of NMR instruments. The ability to use ACD/Labs software in combination with NMR software Delta for advanced spectra processing, automated structure verification and industry-standard databasing gives JEOL users access to the most advanced tools available. Furthermore, ACD/Labs’ software offers the capability for chemists to process and analyze LC/MS, UV/Vis, IR, and all other analytical data using the same software, regardless of data format."
• JSM-IT810 released, a new Field Emission SEM

  Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features 1. Automatic Observation and Analysis Function "Neo Action" All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function "SEM Automatic Adjustment Package" This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. "Live Function" This function is capable of Live 3D, ...
• JEOL is releasing new triple quadrupole mass spectrometer

  JEOL Ltd. (President Gon-emon Kurihara) announces the release of new Gas Chromatograph(GC) -  triple quadrupole mass spectrometer system, JMS-TQ4000GC on August, 2018. JMS-TQ4000GC is a GC-triple quadrupole mass spectrometer system with both capabilities of high throughput and high sensitivity based on the unique “Short collision cell technology”. Those capabilities can improve the productivity for routine analysis such as residual pesticides analysis in agricultural materials or monitoring of trace amount of chemicals regulated by tap water quality standard and environmental criteria in each region or country. It is expected that JMS-TQ4000GC would contribute to expand JEOL’s market share of not only GC-triple quadrupole mass spectrometer but also GC-single quadrupole mass spectrometer or GC –time-of-flight mass spectrometer. [Main Features] 1.   Short collision cell technology enables high speed data acquisition without crosstalk JMS-TQ4000GC can achieve the fastest SRM (Selected Reaction Monitor) switching speed in the industry at 1,000 channels/sec. Moreover, even at the fast SRM it can eliminate ion interaction among SRM channels (crosstalk) and makes it possible to analyze multi-target compounds with high accuracies. 2.   High sensitivity achieved with ion accumulation and pulsed ion ejection at short ...
• JEOL introduces the JSM-IT500

  JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis. Key point 1 : Zeromag The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis. Key point 2 : Live Analysis (Only for A/LA) With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image. Key point 3 : Integrated data management software This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click. Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E      
• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...
• JEOL introduces the JSM-IT200

  JEOL combines ease of use, high resolution and quick analysis in the latest SEM model. With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis. “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis. Autofunctions will do the microscope adjustments. Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging. Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results. The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM. For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).