Electron Microscopy, NMR & Mass Spectometry News

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• New software for SEM Asbestos Analysis

  Application Note: Frame Step Analyzer for Asbestos analysis. We have released a software module for JEOL SEMs to assist the operator with asbestos analysis. The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field. When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.   Applicable instruments: IT100, IT200, IT300 and IT500 series For more information please contact us.
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  JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

  JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. Nikon has joined JEOL to sell the Neoscope. Features 1) Simple operation Easy touch panel operation A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness) Easy, dependable auto gun alignment (filament centering) 2) Enhanced low vacuum capability Enhanced quality of backscattered electron images Easy observation of non conductive samples in the direct low vacuum mode Only 2 minutes 30 seconds from sample loading to imaging 3) New capabilities for imaging Secondary electron imaging and backscattered electron imaging supported at high vacuum Dual frame imaging to facilitate comparison of live and retrieved images A wide magnification range from the lowest 10x for wide area of view up to 60,000x 4) A complete line of optional accessories Energy dispersive X-ray spectrometer Tilt/rotation motor drive specimen holder *Both options ...
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  JEOL released the JCM-7000 Benchtop SEM

  The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made. Main Features: With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis. With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area. With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis. A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.   For more information please visit https://www.jeol.co.jp/en/products/detail/JCM-7000.html
• JEOL Present at Medica 2021

  Overview: JEOL has gained global confidence as a leading manufacturer of clinical chemistry analyzers. More than 10,000 of our clinical chemistry analyzers have been placed on the market all over the world under JEOL brand and as OEM products, extending our dedication to healthcare beyond Japan. With our 3rd appearance in MEDICA, we are privileged to introduce BioMajesty™ series, clinical chemistry with unique but proven technologies. It is our mission to cater to global needs for premium quality "MADE IN JAPAN" products. (*) BioMajesty™ is a registered trademark of JEOL Ltd. Date/Period: 15th – 18th November, 2021 Location: Messe Düsseldorf　 Booth No: Hall3, 3B27 Website:  https://www.medica-tradefair.com/ Displayed instruments : JCA-BM6070/C https://www.jeol.co.jp/en/products/detail/JCA-BM6070_C.html JEOL Europe Medical Equipment Center(JEMEC) in Zaventem Belgium (2 hours drive from Düsseldorf )      We welcome anyone interested in stopping by at JEMEC the week after MEDICA.      For more information, please contact Mr. Tanabe tanabe@jeolbenelux.com  .      JEMEC : https://www.jeolbenelux.com/About-Us/JEOL-Europe-Medical-Equipment-Center-JEMEC
• JEOL Present at Labtechnology 2019

  On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17..  We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC To sign up for this event, please visit https://labtechnology.nl
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  JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

  JEOL announced the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of m/z 10-30,000 - the highest resolving power of all commercial MALDI-TOF systems. JEOL’s patented technology consists of a staggered figure-8 ion trajectory of 17 meters. By refocusing the ion packets during each turn, the divergence of the ions is reduced over the flight distance. The SpiralTOF ion optical system is engineered to overcome the limits of delayed extraction with kinetic energy convergence resulting in high sensitivity, resolving power and mass accuracy (less than 1ppm) over a wide mass range. To meet the diverse needs of researchers, the SpiralTOF is available in four configurations: MALDI-TOFMS with unsurpassed high mass resolving power and high mass accuracy Linear TOF option for high sensitivity analysis of high molecular weight samples and/or those that undergo post-source decay TOF/TOF option for ...