Electron Microscopy, NMR & Mass Spectometry News

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  JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F

  An ultimate analytical tool for a wide range of applications Scanning electron microscopes are used in a wide range of fields from basic material research to specific applications in production. The JSM-7800F is an ultimate analytical tool that answers a wide variety of users' needs. With its new super hybrid objective lens, the microscope is capable of high resolution imaging as well as high speed, high precision elemental analysis. Features Ultimate resolution The super hybrid objective lens achieves resolutions of 0.8 nm (15 kV) and 1.2 nm (1 kV). High speed, high precision elemental analysis The microscope performs speedy sample analysis with the optimally focused electron probe at high current without compromising the analytical accuracy and the quality of elemental mapping. High quality data acquired by stable electron probe The long lasting in-lens thermal electron gun produces a stable probe, which allows for continuous acquisition of high quality data from imaging and from various analysis including EDS, WDS, EBSD, and CL. Support of wide ranging samples The super hybrid objective lens can image/analyze magnetic samples at high magnification. It also makes imaging of non conductive samples easy.
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  First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

  The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division. UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab. “At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. The ARM200F represents more than 60 years of TEM expertise at JEOL ...
• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...
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  JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

  JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. Nikon has joined JEOL to sell the Neoscope. Features 1) Simple operation Easy touch panel operation A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness) Easy, dependable auto gun alignment (filament centering) 2) Enhanced low vacuum capability Enhanced quality of backscattered electron images Easy observation of non conductive samples in the direct low vacuum mode Only 2 minutes 30 seconds from sample loading to imaging 3) New capabilities for imaging Secondary electron imaging and backscattered electron imaging supported at high vacuum Dual frame imaging to facilitate comparison of live and retrieved images A wide magnification range from the lowest 10x for wide area of view up to 60,000x 4) A complete line of optional accessories Energy dispersive X-ray spectrometer Tilt/rotation motor drive specimen holder *Both options ...
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  Multi-touch Interface Creates New Electron Microscope Experience with JEOL InTouch Scope™

  JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen. Ease of use is a key feature of all JEOL SEMs, and the versatile InTouch Scope has functions that users of all levels will appreciate: automatic SEM condition setup based on sample type simultaneous multiple live image and movie capture easy sample navigation at 5x – 300,000x magnifications quantitative and qualitative elemental analysis low and high vacuum operation Wireless capability. The In-Touch Scope features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. An onboard ...
• Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

  JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation. Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include: High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).