Electron Microscopy, NMR & Mass Spectometry News

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• JPS-9030: The XPS for high-speed, high-precision depth profiling

  In recent years, there has been a growing demand to perform high quality surface analysis quickly, easily and reproducibly on any kind of sample for any level user. The JPS-9030 is equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design. Main Features Depth profiling optimized for the application The newly-developed Kaufman-type etching ion source provides etching rates from 1 nm/min to 100 nm/min (SiO2equivalent), and allows a wide range of settings. It is capable of depth profiles suitable for any application, from measurements demanding precision to processes that require speed. The mounting of the Kaufman-type etching ion source to the specimen exchange chamber facilitates prevention of  contamination of the measurement chamber. Newly-developed software provides even greater ease-of-use SpecSurf Ver. 2.0 now incorporates a ribbon-style GUI, offering a user-friendly environment in which all operations can be performed with the mouse. With JEOL’s own automatic qualitative analysis function, it is possible to sequentially perform qualitative, quantitative and chemical state analyses for multiple acquisition points. Ultra-high surface sensitivity The JPS-9030 supports techniques like Angle-Resolved XPS (ARXPS) and ...
• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...
• JEOL Present at Medica 2021

  Overview: JEOL has gained global confidence as a leading manufacturer of clinical chemistry analyzers. More than 10,000 of our clinical chemistry analyzers have been placed on the market all over the world under JEOL brand and as OEM products, extending our dedication to healthcare beyond Japan. With our 3rd appearance in MEDICA, we are privileged to introduce BioMajesty™ series, clinical chemistry with unique but proven technologies. It is our mission to cater to global needs for premium quality "MADE IN JAPAN" products. (*) BioMajesty™ is a registered trademark of JEOL Ltd. Date/Period: 15th – 18th November, 2021 Location: Messe Düsseldorf　 Booth No: Hall3, 3B27 Website:  https://www.medica-tradefair.com/ Displayed instruments : JCA-BM6070/C https://www.jeol.co.jp/en/products/detail/JCA-BM6070_C.html JEOL Europe Medical Equipment Center(JEMEC) in Zaventem Belgium (2 hours drive from Düsseldorf )      We welcome anyone interested in stopping by at JEMEC the week after MEDICA.      For more information, please contact Mr. Tanabe tanabe@jeolbenelux.com  .      JEMEC : https://www.jeolbenelux.com/About-Us/JEOL-Europe-Medical-Equipment-Center-JEMEC
• JEOL introduces the JSM-IT200

  JEOL combines ease of use, high resolution and quick analysis in the latest SEM model. With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis. “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis. Autofunctions will do the microscope adjustments. Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging. Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results. The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM. For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).
• JEOL introduces the InfiTOF Spectrometer JMS-MT3010HRGA

  The InfiTOF  Spectrometer JMS-MT3010HRGA is a Time-of-Flight Mass Spectrometer using Multi-turn® and Perfect focusing® technologies, which achieves high mass-resolving power in a very compact package. This mass spectrometer is designed for real time monitoring of directly introduced gas. It is a high mass-resolution mass spectrometer with stability for real time gas monitoring and capable of elemental composition determination through accurate mass measurement. High-Resolution Gas Monitoring MS measurement results shown below are acquired by introducing the standard gases (10 ppm each) and then performing sequential measurement of 4 hours at high mass resolution conditions. High-resolution gas monitoring is enabled for all components over a long period of time with high stability. High Mass Resolving Power An innovative Multi-Turn technology makes the spectrometer compact while maintaining high mass resolving power. The maximum resolving power of 40,000 (FWHM) or higher is achieved even for ...
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  JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

  JEOL announced the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of m/z 10-30,000 - the highest resolving power of all commercial MALDI-TOF systems. JEOL’s patented technology consists of a staggered figure-8 ion trajectory of 17 meters. By refocusing the ion packets during each turn, the divergence of the ions is reduced over the flight distance. The SpiralTOF ion optical system is engineered to overcome the limits of delayed extraction with kinetic energy convergence resulting in high sensitivity, resolving power and mass accuracy (less than 1ppm) over a wide mass range. To meet the diverse needs of researchers, the SpiralTOF is available in four configurations: MALDI-TOFMS with unsurpassed high mass resolving power and high mass accuracy Linear TOF option for high sensitivity analysis of high molecular weight samples and/or those that undergo post-source decay TOF/TOF option for ...