Electron Microscopy, NMR & Mass Spectometry News

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• JEOL introduces the JSM-IT200

  JEOL combines ease of use, high resolution and quick analysis in the latest SEM model. With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis. “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis. Autofunctions will do the microscope adjustments. Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging. Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results. The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM. For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).
• JEOL introduces the JSM-IT500

  JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis. Key point 1 : Zeromag The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis. Key point 2 : Live Analysis (Only for A/LA) With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image. Key point 3 : Integrated data management software This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click. Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E      
• JEOL introduces the InfiTOF Spectrometer JMS-MT3010HRGA

  The InfiTOF  Spectrometer JMS-MT3010HRGA is a Time-of-Flight Mass Spectrometer using Multi-turn® and Perfect focusing® technologies, which achieves high mass-resolving power in a very compact package. This mass spectrometer is designed for real time monitoring of directly introduced gas. It is a high mass-resolution mass spectrometer with stability for real time gas monitoring and capable of elemental composition determination through accurate mass measurement. High-Resolution Gas Monitoring MS measurement results shown below are acquired by introducing the standard gases (10 ppm each) and then performing sequential measurement of 4 hours at high mass resolution conditions. High-resolution gas monitoring is enabled for all components over a long period of time with high stability. High Mass Resolving Power An innovative Multi-Turn technology makes the spectrometer compact while maintaining high mass resolving power. The maximum resolving power of 40,000 (FWHM) or higher is achieved even for ...
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  JEOL introduces the JSM-F100

  JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly. Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.   For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html  
• JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

  Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions. Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis). PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ...
• JEOL introduces the IB-19530CP Cross section Polisher

  The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders. The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.   For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html