Electron Microscopy, NMR & Mass Spectometry News

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  New Cross Section Polisher™ IB-19540CP/ Cooling Cross Section Polisher™ IB-19550CCP

  JEOL announces the release of two new Cross Section Polishers for Electron Microscopes. ☑  New GUI and Internet of Things (IoT) ～ user-friendly and remote control-enabled. ☑  High throughput ion source. ☑  High throughput cooling system ～ auto cooling and auto return to room temperature. Click below to learn more or contact your local JEOL office.  Product info HERE🔗  News release HERE 🔗 
• JEOL introduces the JSM-IT200

  JEOL combines ease of use, high resolution and quick analysis in the latest SEM model. With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis. “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis. Autofunctions will do the microscope adjustments. Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging. Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results. The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM. For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).
• JEOL Introduces the JSM-IT500HR

  The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image. For application examples and to see how the features work, please visit our corporate website: https://www.jeol.co.jp/en/products/special_edition/2017/special01.html
• JEOL introduces the JSM-IT500

  JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis. Key point 1 : Zeromag The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis. Key point 2 : Live Analysis (Only for A/LA) With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image. Key point 3 : Integrated data management software This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click. Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E      
• JEOL introduces the InfiTOF Spectrometer JMS-MT3010HRGA

  The InfiTOF  Spectrometer JMS-MT3010HRGA is a Time-of-Flight Mass Spectrometer using Multi-turn® and Perfect focusing® technologies, which achieves high mass-resolving power in a very compact package. This mass spectrometer is designed for real time monitoring of directly introduced gas. It is a high mass-resolution mass spectrometer with stability for real time gas monitoring and capable of elemental composition determination through accurate mass measurement. High-Resolution Gas Monitoring MS measurement results shown below are acquired by introducing the standard gases (10 ppm each) and then performing sequential measurement of 4 hours at high mass resolution conditions. High-resolution gas monitoring is enabled for all components over a long period of time with high stability. High Mass Resolving Power An innovative Multi-Turn technology makes the spectrometer compact while maintaining high mass resolving power. The maximum resolving power of 40,000 (FWHM) or higher is achieved even for ...
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  JEOL introduces the JSM-F100

  JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly. Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.   For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html