Electron Microscopy, NMR & Mass Spectometry News

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  JEM-ARM200F, An Ultimate Atomic Resolution Transmission Electron Microscope

  JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009. Background Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyze the elements constituting substances and the status of electrons by incorporating various analyzers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS). A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis. Features Atomic level resolution - STEM: 0.08 nm; TEM: 0.11 nm Standard spherical aberration corrector for electron optic system eliminating spherical aberrations Maximum accelerating voltage 200 kV
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  First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

  The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division. UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab. “At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. The ARM200F represents more than 60 years of TEM expertise at JEOL ...
• JEM-2100Plus: A new 200kV Transmission Electron Microscope

  The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies. Main Features Designed to ease of operation 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation. A complete range of automated functions The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation. Advanced integration The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction. Image view/edit software Viewer software supports off-line image viewing and editing. Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries. Main Specifications Maximum accelerating voltage 200kV Guaranteed resolution 0.14 nm(TEM lattice image) Magnification x30 to x800,000 The JEM-2100Plus can be configured to support a variety of applications from cryo TEM to ultra high ...
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  JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F

  An ultimate analytical tool for a wide range of applications Scanning electron microscopes are used in a wide range of fields from basic material research to specific applications in production. The JSM-7800F is an ultimate analytical tool that answers a wide variety of users' needs. With its new super hybrid objective lens, the microscope is capable of high resolution imaging as well as high speed, high precision elemental analysis. Features Ultimate resolution The super hybrid objective lens achieves resolutions of 0.8 nm (15 kV) and 1.2 nm (1 kV). High speed, high precision elemental analysis The microscope performs speedy sample analysis with the optimally focused electron probe at high current without compromising the analytical accuracy and the quality of elemental mapping. High quality data acquired by stable electron probe The long lasting in-lens thermal electron gun produces a stable probe, which allows for continuous acquisition of high quality data from imaging and from various analysis including EDS, WDS, EBSD, and CL. Support of wide ranging samples The super hybrid objective lens can image/analyze magnetic samples at high magnification. It also makes imaging of non conductive samples easy.
• Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

  JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation. Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include: High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).
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  JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

  JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. Nikon has joined JEOL to sell the Neoscope. Features 1) Simple operation Easy touch panel operation A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness) Easy, dependable auto gun alignment (filament centering) 2) Enhanced low vacuum capability Enhanced quality of backscattered electron images Easy observation of non conductive samples in the direct low vacuum mode Only 2 minutes 30 seconds from sample loading to imaging 3) New capabilities for imaging Secondary electron imaging and backscattered electron imaging supported at high vacuum Dual frame imaging to facilitate comparison of live and retrieved images A wide magnification range from the lowest 10x for wide area of view up to 60,000x 4) A complete line of optional accessories Energy dispersive X-ray spectrometer Tilt/rotation motor drive specimen holder *Both options ...