Electron Microscopy, NMR & Mass Spectometry News

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  First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

  The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division. UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab. “At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. The ARM200F represents more than 60 years of TEM expertise at JEOL ...
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  JEM-ARM200F, An Ultimate Atomic Resolution Transmission Electron Microscope

  JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009. Background Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyze the elements constituting substances and the status of electrons by incorporating various analyzers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS). A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis. Features Atomic level resolution - STEM: 0.08 nm; TEM: 0.11 nm Standard spherical aberration corrector for electron optic system eliminating spherical aberrations Maximum accelerating voltage 200 kV
• Festive Inauguration of the JEM-3200FSC in Delft

  From the 4th till the 6th of September TU Delft organised a symposium in honor of the inauguration of the JEOL JEM-3200FSC installed this year at the BioNanoScience department of TU Delft. Many well known scientists in the Structural Biology field joined this event and presented their most recent work. Two very intensive days of presentations were followed by a 3rd day of workshops given by participating companies. On the symposium website you can find the full list of speakers: https://www.tudelft.nl/en/cryo-em-symposium/program/ Below some photo's of Prof. Fujiyoshi and Prof. Dubochet presenting.    
• Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

  24th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University: ·         Inflammation Research Center (VIB-IRC) ·         Plant Systems Biology (VIB-PSB) ·         Medical Biotechnology Center (VIB-MBC) ·         VIB Core facilities ·         Center for Medical Genetics Ghent University (CMGG) In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment. The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.    Pictures: TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility. BOTTOM Mrs ...
• CryoARM300 inauguration @ VIB Brussels 19th September 2018

  The CryoARM300 at VIB Brussels will be inaugurated during the BECM sattelite meeting. The goal of the satellite lectures is to demonstrate the state of the art Cryo-EM options from a mostly technical perspective. The day will end with the BECM Inaugural Lecture to celebrate the installation of the CryoARM300 by Nobel Laureate Richard Henderson and a reception with barbecue. This event precedes the Structural Dynamics in Cellular Communication conference on 20-21 September 2018 in Brussels, Belgium. You can find out more about this meeting on the conference website. For more information and to register, please visit https://vib.formstack.com/forms/becm_satellite_meeting_registration
• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...