Electron Microscopy, NMR & Mass Spectometry News

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• Release of the JEM-F200, a multi purpose TEM

  JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM. The F2 incorporates many new features:  Smart- design, with a new intuitive user interface Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements. Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS. Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample ...
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  First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

  The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division. UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab. “At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. The ARM200F represents more than 60 years of TEM expertise at JEOL ...
• JEOL present at the 42nd ISCC & 15th GCxGC Symposium from May 13-18

  JEOL will be present at the 42nd International Conference Symposium on Capillary Chromatography (ISCC) jointly organized with the 15th GCxGC Symposium, which will be held this year in Riva del Garda, Italy from May 13th-18th. We will have a booth displaying our latest developments, which will be presented in detail during a seminar. The last conference in 2016 was very successful with 830 participants, from all around the world, and with 41 exhibitors. This year particular emphasis will be directed to all Comprehensive Separation Technologies and MS Hyphenation and to capillary chromatography and 2D GC with various forms of MS from unit-mass to high resolution, and from single to hybrid analyzers. For more information, please visit the website
• The JEM-F200 at the NKI is featured in BioTech and Life Sciences

  Biotech and Life Sciences has featured the JEM-F200 installed at the NKI.  IThe article can be found on page 21 in the following link and explains what the NKI will do with the microscope: https://www.biotechnews.eu/fileadmin/pdf/2019-najaar/2019_Biotechnews_november.pdf  
• New Versatile Compact SEM from JEOL

    JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design. The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes. With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions. JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.  
• JEOL and ACD/Labs Sign Distribution Agreement for ACD/NMR software

  JEOL and Advanced Chemistry Development, Inc. (ACD/Labs) announced they have concluded a distribution agreement for ACD/NMR software. NMR Predictor Suite having a structure predictive function is the software which can predict an NMR spectrum from chemical structure information, among ACD/NMR software. It is the tool which can perform structure analysis easily. For a user who is considering purchase of NMR for the first time, that will be valuable source of structral analysis information. "We're very excited to work with JEOL and bring our tools to their customers around the world," Dimitris Argyropoulos, NMR Business Manager at ACD/Labs, commented. "JEOL has been producing scientific instrumentation for the past 70 years and is a well-known and respected supplier of NMR instruments. The ability to use ACD/Labs software in combination with NMR software Delta for advanced spectra processing, automated structure verification and industry-standard databasing gives JEOL users access to the most advanced tools available. Furthermore, ACD/Labs’ software offers the capability for chemists to process and analyze LC/MS, UV/Vis, IR, and all other analytical data using the same software, regardless of data format."