Electron Microscopy, NMR & Mass Spectometry News

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• JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

  Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development. However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution. To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary. In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis. Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, ...
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  JEM-ARM200F, An Ultimate Atomic Resolution Transmission Electron Microscope

  JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009. Background Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyze the elements constituting substances and the status of electrons by incorporating various analyzers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS). A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis. Features Atomic level resolution - STEM: 0.08 nm; TEM: 0.11 nm Standard spherical aberration corrector for electron optic system eliminating spherical aberrations Maximum accelerating voltage 200 kV
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  JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F

  An ultimate analytical tool for a wide range of applications Scanning electron microscopes are used in a wide range of fields from basic material research to specific applications in production. The JSM-7800F is an ultimate analytical tool that answers a wide variety of users' needs. With its new super hybrid objective lens, the microscope is capable of high resolution imaging as well as high speed, high precision elemental analysis. Features Ultimate resolution The super hybrid objective lens achieves resolutions of 0.8 nm (15 kV) and 1.2 nm (1 kV). High speed, high precision elemental analysis The microscope performs speedy sample analysis with the optimally focused electron probe at high current without compromising the analytical accuracy and the quality of elemental mapping. High quality data acquired by stable electron probe The long lasting in-lens thermal electron gun produces a stable probe, which allows for continuous acquisition of high quality data from imaging and from various analysis including EDS, WDS, EBSD, and CL. Support of wide ranging samples The super hybrid objective lens can image/analyze magnetic samples at high magnification. It also makes imaging of non conductive samples easy.
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  Multi-touch Interface Creates New Electron Microscope Experience with JEOL InTouch Scope™

  JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen. Ease of use is a key feature of all JEOL SEMs, and the versatile InTouch Scope has functions that users of all levels will appreciate: automatic SEM condition setup based on sample type simultaneous multiple live image and movie capture easy sample navigation at 5x – 300,000x magnifications quantitative and qualitative elemental analysis low and high vacuum operation Wireless capability. The In-Touch Scope features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. An onboard ...
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  JEOL Ships 10,000th Scanning Electron Microscope

  Industry's SEM of Choice for 31 Years We announce with pride the shipment of the 10,000th general scanning electron microscope in 31 years since our first model, JSM-T20, was installed in 1975. We could not have achieved this milestone without your continued patronage. The table below summarizes the cumulative total of general scanning electron microscopes shipped and the model changes over time. Many different models, from the first JSM-T20 to the latest JCM-5700, have been used for a wide range of applications. Today's achievement is only a passing point. We will continue our effort in producing superior and versatile microscopes for years to come.
• Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

  JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation. Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include: High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).