Electron Microscopy, NMR & Mass Spectometry News

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• JEOL releases the JSM-IT300HR

  The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM. This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun.  Main features: New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis. Small footprint equivalent to the conventional general-purpose SEM. More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html
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  JSM-7100F Thermal field emission electron microscope

  Observation of nano-structures The unique high power optics of JSM-7100F guarantees 1.2nm resolution. High magnification for the study of nano-structures is easily obtained. Stable high precision analysis The in-lens thermal FEG produces a stable large probe current. You can obtain high quality observation and analysis results. The emitter is guaranteed for 3 years. Magnetic specimens The objective lens of the JSM-7100F does not form magnetic field around a specimen. Magnetic specimens can be observed and analyzed without restriction. Analysis of nano-structures A small probe diameter is obtained with the patented aperture angle optimizing lens. You can acquire high precision analyses and high quality elemental maps in a short time by using a large probe current. A variety of analytical equipment including EDS, WDS, and EBSD can be mounted their ideal geometry. Clean vacuum A specimen is introduced through the specimen exchange airlock chamber. The specimen chamber is always kept in clean high vacuum. The unique one action specimen exchange mechanism lets you insert and remove a specimen with simple operation. The specimen chamber is pumped with a TMP. In-lens thermal FEG The patented in-lens thermal FEG is efficient and produces ...
• JEOL introduces the JSM-IT500

  JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis. Key point 1 : Zeromag The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis. Key point 2 : Live Analysis (Only for A/LA) With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image. Key point 3 : Integrated data management software This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click. Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E      
• Inauguration of the JEM-ARM200F in Leuven

  You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG). Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research. This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials ...
• JEOL present at the 42nd ISCC & 15th GCxGC Symposium from May 13-18

  JEOL will be present at the 42nd International Conference Symposium on Capillary Chromatography (ISCC) jointly organized with the 15th GCxGC Symposium, which will be held this year in Riva del Garda, Italy from May 13th-18th. We will have a booth displaying our latest developments, which will be presented in detail during a seminar. The last conference in 2016 was very successful with 830 participants, from all around the world, and with 41 exhibitors. This year particular emphasis will be directed to all Comprehensive Separation Technologies and MS Hyphenation and to capillary chromatography and 2D GC with various forms of MS from unit-mass to high resolution, and from single to hybrid analyzers. For more information, please visit the website
• Festive Inauguration of the JEM-3200FSC in Delft

  From the 4th till the 6th of September TU Delft organised a symposium in honor of the inauguration of the JEOL JEM-3200FSC installed this year at the BioNanoScience department of TU Delft. Many well known scientists in the Structural Biology field joined this event and presented their most recent work. Two very intensive days of presentations were followed by a 3rd day of workshops given by participating companies. On the symposium website you can find the full list of speakers: https://www.tudelft.nl/en/cryo-em-symposium/program/ Below some photo's of Prof. Fujiyoshi and Prof. Dubochet presenting.