Electron Microscopy, NMR & Mass Spectometry News

JSM-IT810 released, a new Field Emission SEM

Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis.
The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages.

Main Features
1. Automatic Observation and Analysis Function "Neo Action"
All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work.

2. Automatic Calibration Function "SEM Automatic Adjustment Package"
This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration.

3. "Live Function"
This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping.

4. EDS Integration
Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.

Click here to learn more.  Or contact the JEOL BV sales team sales@jeolbenelux.com

JEOL Present at Laborama 2022

JEOL (Europe) BV will be present at Laborama 2022, on the 18th and 19th of May in the Brussels Expo in Brussels. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B17. We will have our JCM-7000 Benchtop SEM on display.

For more Information about this event, please visit: http://expo.laborama.be/nl

JEOL (Europe) BV offering Refurbished Instruments

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

• JEM-1010 100kV TEM with Megaview Camera

               JEM-1010

• JEM-1200EXII 120kV TEM with STEM
• JEM-1200EXII 120kV TEM with Orius Camera and EDX

                      JEM-1200EXII

• JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
• JSM-6060LV Compact W-SEM with SE and BSE detector

               JSM-6060LV 

• JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

               JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com

JEOL introduces the JSM-F100

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

JEOL Present at Labtechnology 2019

On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17.. 

We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC

To sign up for this event, please visit https://labtechnology.nl

Precisiebeurs 2019

JEOL (Europe) BV will be present at the Precision Fair 2019 on the 13th and 14th ofNovember at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our brandnew JCM-7000 Benchtop SEM.

To pre-register, please visit https://precisiebeurs.nl/

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

• “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
• Autofunctions will do the microscope adjustments.
• Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
• Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
• The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

JEOL present at the Precision Fair 2018

JEOL (Europe) BV will be present at the Precision Fair 2018 on the 14th and 15th of november at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our JCM-6000Plus Benchtop SEM

To pre-register, please visit https://precisiebeurs.nl/

Visit JEOL at WOTS 2018

WOTS 2018 will be held from October 2nd until October 5th in the Jaarbeurs Utrecht.

JEOL will be present with live SEM demonstrations on our latest model, the JSM-IT200 and we will have our latest Triple Quad Mass Spectrometer on display, the JMS-TQ4000GC.

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 07E084.