Electron Microscopy, NMR & Mass Spectometry News

JSM-IT810 released, a new Field Emission SEM

Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis.
The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages.

Main Features
1. Automatic Observation and Analysis Function "Neo Action"
All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work.

2. Automatic Calibration Function "SEM Automatic Adjustment Package"
This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration.

3. "Live Function"
This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping.

4. EDS Integration
Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.

Click here to learn more.  Or contact the JEOL BV sales team sales@jeolbenelux.com

JEOL Introduces the JSM-IT500HR

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

1. High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
2. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
3. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
4. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).