Electron Microscopy, NMR & Mass Spectometry News

JEOL released the JCM-7000 Benchtop SEM

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

Main Features:

With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis.

With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area.

With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis.

A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.

For more information please visit https://www.jeol.co.jp/en/products/detail/JCM-7000.html

JEOL Periodic Table app

JEOL USA has developed an app to assist researchers with EDS, NMR and MS research. Using the JEOL Periodic Table app you have quick and easy access to the spectral data of all known elements while doing EDS in electron microscopy, nuclear magnetic resonance or mass spectrometry.

The app is available in the apple appstore: https://itunes.apple.com/us/app/jeol-usa-periodic-table/id1459184462?ls=1&mt=8

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

• Smart- design, with a new intuitive user interface
• Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
• Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
• Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
• Specporter, an auto holder loading/unloading device.
• Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
• Dual SDD, for very fast EDS analysis and minimal sample damage.
• Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)