JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

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JEOL Present at Labtechnology 2019

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On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17.. 

We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC

To sign up for this event, please visit https://labtechnology.nl

August 2, 2019 By Arnold Kruize Event Benchtop SEM, SEM, Triple Quad 0 0 Comment Read More »
JCM-7000 New.jpg

JEOL released the JCM-7000 Benchtop SEM

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

Main Features:

With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis.

With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area.

With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis.

A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.

 

For more information please visit https://www.jeol.co.jp/en/products/detail/JCM-7000.html

August 2, 2019 By Arnold Kruize Product Introduction Benchtop SEM, EDX, SEM-EDX 0 0 Comment Read More »

JEOL present at Materials 2016

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

For more information, please visit the website https://materials.nl/

March 31, 2016 By Arnold Kruize Event Benchtop SEM, Desktop SEM, Elemental Analysis, Material Characterisation, SEM 0 0 Comment Read More »

New Versatile Compact SEM from JEOL

 

JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.

With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.

 

November 13, 2015 By Arnold Kruize General Benchtop SEM, Compact SEM, ease of use, Easy to use, Intuitive, JEOL, SEM, SEM EDS, SEM EDX, Tabletop SEM 0 0 Comment Read More »

JEOL (Europe) BV present at Labtechnology 2015

On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18.

To register for this exhibition please visit https://labtechnology.nl/

Logo Exhibition Labtechnology 2015

 

August 28, 2015 By Arnold Kruize Event Benchtop SEM, GCMS, MS, Netherlands, NMR, Phenom, SEM, tabletop SEM, TEM, Benelux, JEOL, Neoscope 0 0 Comment Read More »

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