Electron Microscopy, NMR & Mass Spectometry News

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• JEOL released the JSM-IT800 FE-SEM

  JEOL has released the JSM-IT800 FE-SEM, the most powerful SEM to date, guaranteeing a resolution of 0.5nm @ 15kV and 0.9nm at 500V. The JSM-IT800 incorporates our In-lens Schottky Plus field emission electron gun for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a seamless GUI "SEM Center" for full integration of a JEOL energy dispersive X-ray spectrometer (EDS). Furthermore, the JSM-IT800 allows for two types of objective lens configurations, offering different versions to satisfy various users requirements. The two versions of the JSM-IT800 include the Hybrid Lens (HL) version for a general-purpose SEM and the Super Hybrid Lens (SHL) version for enhanced high resolution observation and various analyses. In addition, the JSM-IT800 of the SHL version comes with a new Upper Hybrid Detector (UHD) to acquire higher signal-to-noise ratio images for the study of fine structures of specimens. The JSM-IT800 can also be equipped with a new Scintillator Backscattered Electron Detector (SBED) and a Versatile Backscattered Electron Detector (VBED). The SBED enables acquisition of images with high responsiveness and produces sharp material contrast ...
• Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

  JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation. Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include: High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).
• JSM-IT810 released, a new Field Emission SEM

  Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features 1. Automatic Observation and Analysis Function "Neo Action" All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function "SEM Automatic Adjustment Package" This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. "Live Function" This function is capable of Live 3D, ...
• Release of the JIB-4700F Multi Beam System

  The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens. Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features.  For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JIB-4700F.html
• JEOL releases the JSM-IT300HR

  The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM. This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun.  Main features: New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis. Small footprint equivalent to the conventional general-purpose SEM. More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html
• Release of the JEM-F200, a multi purpose TEM

  JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM. The F2 incorporates many new features:  Smart- design, with a new intuitive user interface Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements. Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS. Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample ...