Electron Microscopy, NMR & Mass Spectometry News

Festive Inauguration of the JEM-3200FSC in Delft

From the 4th till the 6th of September TU Delft organised a symposium in honor of the inauguration of the JEOL JEM-3200FSC installed this year at the BioNanoScience department of TU Delft. Many well known scientists in the Structural Biology field joined this event and presented their most recent work. Two very intensive days of presentations were followed by a 3rd day of workshops given by participating companies.

On the symposium website you can find the full list of speakers: https://www.tudelft.nl/en/cryo-em-symposium/program/

Below some photo's of Prof. Fujiyoshi and Prof. Dubochet presenting.

JEOL present at LabAnalyse 2017

On the 19th of September the exhibition LabAnalyse 2017 will be held at in "de Kuip" in Rotterdam. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. 

For more information, please visit https://labtechnology.nl/energieonderzoek/

JEOL present at Labtechnology 2017

On the 3rd and 4th of October the exhibition Labtechnology 2017 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth B16. 

To sign up for this event, please visit https://labtechnology.nl

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html

JEOL introduces the JSM-IT500

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E