JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL NMR in high demand

The New JNM-ECZ High field NMR series is booming. Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems. With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

 

                                                                                        NMR Spectrometer - JEOL Benelux

JEOL present at Laborama 2017

JEOL (Europe) BV will be present at the Laborama Expo 2017, on the 16th and 17th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our InfiTOF, as well as our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth D5.

 

Release of the JIB-4700F Multi Beam System

The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.


Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. 

JIB-4700F Multi Beam System


For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JIB-4700F.html