Electron Microscopy, NMR & Mass Spectometry News

JEOL present at Labtechnology 2017

On the 3rd and 4th of October the exhibition Labtechnology 2017 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth B16. 

To sign up for this event, please visit https://labtechnology.nl

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html

JEOL introduces the JSM-IT500

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

Release of the JSM-7900 UHR FEG-SEM

JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

JEOL NMR in high demand

The New JNM-ECZ High field NMR series is booming. Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems. With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

JEOL present at Laborama 2017

JEOL (Europe) BV will be present at the Laborama Expo 2017, on the 16th and 17th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our InfiTOF, as well as our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth D5.

Release of the JIB-4700F Multi Beam System

The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.

Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. 

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JIB-4700F.html

JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

JEOL introduces the InfiTOF Spectrometer JMS-MT3010HRGA

The InfiTOF  Spectrometer JMS-MT3010HRGA is a Time-of-Flight Mass Spectrometer using Multi-turn® and Perfect focusing® technologies, which achieves high mass-resolving power in a very compact package. This mass spectrometer is designed for real time monitoring of directly introduced gas. It is a high mass-resolution mass spectrometer with stability for real time gas monitoring and capable of elemental composition determination through accurate mass measurement.

High-Resolution Gas Monitoring

MS measurement results shown below are acquired by introducing the standard gases (10 ppm each) and then performing sequential measurement of 4 hours at high mass resolution conditions. High-resolution gas monitoring is enabled for all components over a long period of time with high stability.

High Mass Resolving Power

An innovative Multi-Turn technology makes the spectrometer compact while maintaining high mass resolving power. The maximum resolving power of 40,000 (FWHM) or higher is achieved even for a low-mass range, such as nitrogen molecule (28.0062 Da). With the conventional compact spectrometers, it was difficult to perform mass separation of gas components like carbon monoxide (27.9949) and nitrogen molecule (28.0062), or carbon dioxide (43.9898) and nitrous oxide (44.0011 Da). However, a new InfiTOF can easily separate these gas components and moreover, this revolutionized spectrometer calculates elemental composition through accurate mass measurement. 

Capable of Measuring Hydrogen Ions

JMS-MT3010HRGA is capable of measuring proton (1.0078 Da; a fragment ion of hydrogen molecule) as well as hydrogen molecule (2.0157 Da). Hydrogen is very difficult to measure with a time-of-flight mass spectrometer because of very low mass and fast flight velocity compared to other elements. The JMS-MT3010HRGA, however, achieves stable measurement of these species. This capability will contribute to research of various advanced materials, including electrolytic reactions and catalyst reactions. 

Main Specifications InfiniTOF

• Mass resolving power 40,000 (FWHM) or higher : m/z 28 of N₂
• Mass range m/z 1 to 1,000
• Sensitivity S/N ≦10, ³⁸Ar in ambient air (direct infusion through a capillary tube)
• Mass stability ≦ 100 ppm/h
• Mass accuracy 3 mDa (Internal standard method) / 5 mDa (External standard merthod)
• Data acquisition speed Up to 2 GS/s
• Spectral recording speed Up to 20 spectra/s
• Dimensions and Weight 430 mm (W) × 625 mm (D) × 552 mm (H) / 40 kgof Main Console (The width of the main console includes the anti-tipping legs.)

JEOL present at WOTS 2016

During WOTS 2016 from October 4th until October 7th in Utrecht, JEOL will be present with live SEM demonstrations and a variety of lectures on the latest developments regarding SEM, TEM, MS and NMR.

Every day presentations will be given in our on-booth lecture room:

Novelties in Liquid and Solids NMR  11:00-11:30

SEM at your fingertips 12:00-12:30

Gas and Volatiles analysis with High resolution MS 14:00-14:30

Introduction to the all-purpose TEM 15:00-15:30

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 7B034.

See you at WOTS 2016!