Electron Microscopy, NMR & Mass Spectometry News

JEOL (Europe) BV offering Refurbished Instruments

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

• JEM-1010 100kV TEM with Megaview Camera

               JEM-1010

• JEM-1200EXII 120kV TEM with STEM
• JEM-1200EXII 120kV TEM with Orius Camera and EDX

                      JEM-1200EXII

• JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
• JSM-6060LV Compact W-SEM with SE and BSE detector

               JSM-6060LV 

• JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

               JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com

First structure from the JEM-F200 at the NKI in Amsterdam

The NKI in Amsterdam has completed their first trial on the JEM-F200 equipped with Gatan K2 Camera and Elsa Cryoholder, The result is a 3.4Å reconstruction on Apoferritin. For this test 120 images were taken in 3 hours. Congratulations to Prof. Dr. Titia Sixma and Prof. Dr. Tassos Perrakis and their colleagues with this very promising test result!

JEOL introduces the JSM-F100

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

JEOL Present at Labtechnology 2019

On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17.. 

We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC

To sign up for this event, please visit https://labtechnology.nl

Precisiebeurs 2019

JEOL (Europe) BV will be present at the Precision Fair 2019 on the 13th and 14th ofNovember at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our brandnew JCM-7000 Benchtop SEM.

To pre-register, please visit https://precisiebeurs.nl/

JEOL released the JCM-7000 Benchtop SEM

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

Main Features:

With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis.

With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area.

With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis.

A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.

For more information please visit https://www.jeol.co.jp/en/products/detail/JCM-7000.html

JEOL Periodic Table app

JEOL USA has developed an app to assist researchers with EDS, NMR and MS research. Using the JEOL Periodic Table app you have quick and easy access to the spectral data of all known elements while doing EDS in electron microscopy, nuclear magnetic resonance or mass spectrometry.

The app is available in the apple appstore: https://itunes.apple.com/us/app/jeol-usa-periodic-table/id1459184462?ls=1&mt=8

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

• “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
• Autofunctions will do the microscope adjustments.
• Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
• Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
• The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

JEOL present at the Precision Fair 2018

JEOL (Europe) BV will be present at the Precision Fair 2018 on the 14th and 15th of november at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our JCM-6000Plus Benchtop SEM

To pre-register, please visit https://precisiebeurs.nl/